Pillar-shaped semiconductor device and method for producing the same

ABSTRACT

In formation of an SRAM cell, a band-shaped contact hole C3 is formed that does not overlap, in plan view. N+ layers 32a, 32c, 32d, and 32f formed on and at outer peripheries of the top portions of Si pillars 6a, 6c, 6d, and 6f, that partly overlaps W layers 33b and 33e on P+ layers 32b and 32e connected to the top portions of Si pillars 6b and 6e, that is connected in both the X direction and the Y direction, and that extends in the Y direction. A power supply wiring metal layer Vdd that connects the P+ layers 32b and 32e through the contact hole C3 is formed. After formation of the power supply wiring metal layer Vdd, a word wiring metal layer WL is formed so as to be orthogonal to the power supply wiring metal layer Vdd in plan view.

RELATED APPLICATIONS

The present application is a continuation application of PCT/JP2019/027541, filed Jul. 11, 2019, the entire content of which is incorporated herein by reference.

BACKGROUND OF THE INVENTION 1. Field of the Invention

The present invention relates to a pillar-shaped semiconductor device and a method for producing the pillar-shaped semiconductor device.

2. Description of the Related Art

In recent years, three-dimensional transistors have been used for LSI (Large Scale Integration). In such three-dimensional transistors, SGTs (Surrounding Gate Transistors), which are pillar-shaped semiconductor devices, have received attention as semiconductor elements used for highly integrated semiconductor devices. A further increase in the degree of integration and a further improvement in the performance of semiconductor devices including SGTs have been required.

Ordinary planar MOS transistors have a channel that extends in a horizontal direction parallel to the upper surface of a semiconductor substrate. In contrast, SGTs have a channel that extends in a direction perpendicular to the upper surface of a semiconductor substrate (e.g., refer to Japanese Unexamined Patent Application Publication No. 2-188966 and Hiroshi Takato, Kazumasa Sunouchi, Naoko Okabe, Akihiro Nitayama, Katsuhiko Hieda, Funrio Horiguchi, and Fujio Masuoka, IEEE Transaction on Electron Devices, Vol. 38, No. 3, pp. 573-578 (1991)). For this reason, compared with planar MOS transistors, SGTs enable an increase in the density of semiconductor devices.

FIGS. 5A and 5B illustrate a schematic structure of an N-channel SGT. FIG. 5A is a sectional view and FIG. 5B is a plan view. A Si pillar 120 of a P or i (intrinsic) conductivity type (hereafter, silicon semiconductor pillars are referred to as “Si pillars”) has, in its upper and lower portions, N⁺ layers 121 a and 121 b (hereafter, semiconductor regions containing a donor impurity in a high concentration are referred to as “N⁺ layers”). When one of the N⁺ layers 121 a and 121 b functions as a source, the other functions as a drain. A portion of the Si pillar 120 between the N⁺ layers 121 a and 121 b, which function as a source and a drain, functions as a channel region 122. A gate insulating layer 123 is formed so as to surround the channel region 122. The N⁺ layer 121 b is formed so as to have a lower end that is flush with the upper end of the gate insulating layer 123 in a vertical direction. The N⁺ layer 121 a is formed so as to have an upper end that is flush with the lower end of the gate insulating layer 123 in a vertical direction. A gate conductor layer 124 is formed so as to surround the gate insulating layer 123. The SGT is constituted by the N⁺ layers 121 a and 121 b functioning as a source and a drain, the channel region 122, the gate insulating layer 123, and the gate conductor layer 124. The N⁺ layer 121 b and a source wiring metal layer S are connected to each other through a contact hole C formed in an insulating layer 125 on the N⁺ layer 121 b. Thus, in plan view, the area occupied by the SGT corresponds to an area occupied by a single source or drain N⁺ layer of a planar MOS transistor. Therefore, a further reduction in the size of the chip can be achieved in SGT-including circuit chips compared with circuit chips including a planar MOS transistor.

To further reduce the size of the chip, some problems need to be overcome. As illustrated in FIGS. 5A and 5B, the contact hole C through which the source wiring metal layer S and the N⁺ layer 121 b are connected to each other is formed above the Si pillar 120 in plan view. As the size of the chip is reduced, the distance between the Si pillar 120 and a Si pillar adjacent to the Si pillar 120 is decreased. This decreases the distance between the contact hole C and a contact hole adjacent to the contact hole C in plan view, which requires a reduction in size and an increase in density in a contact hole formation step.

FIG. 6 is an SRAM cell (Static Random Access Memory) circuit diagram including SGTs. This SRAM cell circuit includes two inverter circuits. One inverter circuit includes a P-channel SGT_Pc1 serving as a load transistor and stn N-channel SGT_Nc1 serving as a drive transistor. The other inverter circuit includes a P-channel SGT_Pc2 serving as a load transistor and an N-channel SGT_Nc2 serving as a drive transistor. The gate of the P-channel SGT_Pc1 and the gate of the N-channel SGT_Nc1 are connected to each other. The drain of the P-channel SGT_Pc2 and the drain of the N-channel SGT_Nc2 are connected to each other. The gate of the P-channel SGT_Pc2 and the gate of the N-channel SGT_Nc2 are connected to each other. The drain of the P-channel SGT_Pc1 and the drain of the N-channel SGT_Nc1 are connected to each other.

As illustrated in FIG. 6, the sources of the P-channel SGTs_Pc1 and Pc2 are connected to a power supply terminal Vdd. The sources of the N-channel SGTs_Nc1 and Nc2 are connected to a ground terminal Vss. Selection N-channel SGTs_SN1 and SN2 are disposed on both sides of the two inverter circuits. The gates of the selection N-channel SGTs_SN1 and SN2 are connected to a word line terminal WLt. The source and drain of the selection N-channel SGT_SN1 are connected to the drains of the N-channel SGT_Nc1 and the P-channel SGT_Pc1 and a bit line terminal BLt, respectively. The source and drain of the selection N-channel SGT_SN2 are connected to the drains of the N-channel SGT_Nc2 and the P-channel SGT_Pc2 and an inverted bit line terminal BLRt, respectively. Thus, the circuit including an SRAM cell is constituted by a total of six SGTs that are two load P-channel SGTS_Pc1 and Pc2, two drive N-channel SGTs_Nc1 and Nc2, and two selection SGTs SN1 and SN2 (e.g., refer to U.S. Patent Application Publication No. 2010/0219483). In this SRAM cell, Si pillars of the two load P-channel SGTs_Pc1 and Pc2 are formed so as to be closest to each other. In this case, the formation of contact holes on the P⁺ layers in upper portions of the load P-channel SGTs_Pc1 and Pc2 poses a problem in terms of increase in the degree of integration of SRAM cells.

SUMMARY OF THE INVENTION

An increase in the degree of integration of a circuit including SGTs is demanded.

A production method according to an aspect of the present invention includes, in a process of forming an static random access memory (SRAM) cell circuit including a surrounding gate transistor (SGT) including a plurality of semiconductor pillars that stand on a substrate in a vertical direction, a gate insulating layer that surrounds the semiconductor pillars, and a gate conductor layer that surrounds the gate insulating layer: a step of forming, as the semiconductor pillars, a first semiconductor pillar that has a first mask material layer on a top portion thereof and a second semiconductor pillar that is adjacent to the first semiconductor pillar and has a second mask material layer on a top portion thereof, the first semiconductor pillar and the second semiconductor pillar forming the SGT; a step of forming a first interlayer insulating layer that is positioned above an upper surface of the gate conductor layer and at outer peripheries of the top portions of the first semiconductor pillar and the second semiconductor pillar; a step of forming, on the first interlayer insulating layer, a first material layer that surrounds side surfaces of the top portion of the first semiconductor pillar and the first mask material layer and a second material layer that surrounds side surfaces of the top portion of the second semiconductor pillar and the second mask material layer; a step of forming a second interlayer insulating layer at outer peripheries in contact with side surfaces of the first material layer and the second material layer; a step of removing the first mask material layer, the second mask material layer, the first material layer, and the second material layer to form a first recessed portion that surrounds the top portion of the first semiconductor pillar and a second recessed portion that surrounds the top portion of the second semiconductor pillar; a step of forming, in the first recessed portion, a first impurity layer that surrounds the top portion of the first semiconductor pillar; a step of forming, in the second recessed portion, a second impurity layer that surrounds the top portion of the second semiconductor pillar; a step of forming a first conductor layer on the first impurity layer and in the first recessed portion; a step of forming a second conductor layer on the second impurity layer and in the second recessed portion; a step of forming a third interlayer insulating layer on the first conductor layer, the second conductor layer, and the second interlayer insulating layer; a step of forming, in the third interlayer insulating layer, a first band-shaped contact hole that partly overlaps and contacts regions of the first conductor layer and the second conductor layer; and a step of forming a first wiring conductor layer connected to the first conductor layer and the second conductor layer such that the first band-shaped contact hole is filled with the first wiring conductor layer, wherein another semiconductor pillar different from the first semiconductor pillar and the second semiconductor pillar is not present in plan view in a region that overlaps the first band-shaped contact hole, and the first impurity layer and the second impurity layer are impurity layers of a load SGT in the SRAM cell circuit.

In the above production method, the first conductor layer and the second conductor layer are desirably formed of a metal, an alloy, or a semiconductor containing a large amount of donor or acceptor impurity atoms and desirably have a single-layer structure or a multilayer structure.

In the above production method, the first impurity layer and the second impurity layer are desirably formed by epitaxial growth.

The above production method desirably includes: a step of forming, after formation of the second interlayer insulating layer, a third mask material layer that partly overlaps a region of the first mask material layer and the first material layer and a region of the second mask material layer and the second material layer in plan view and that has an opening in a connected manner; a step of etching the first mask material layer, the first material layer, the second mask material laver, the second material layer, and the second interlayer insulating layer using the third mask material layer as a mask; a step of removing remaining portions of the first mask material layer, the second mask material layer, the first material layer, and the second material layer to form a third recessed portion; a step of forming, in the third recessed portion, a third impurity layer that covers the top portions of the first semiconductor pillar and the second semiconductor pillar and contains the first impurity layer and the second impurity layer in a connected manner; a step of forming a third conductor layer on the third impurity layer and in the third recessed portion; and a step of forming the first band-shaped contact hole on the third conductor layer, wherein the first band-shaped contact hole is formed inside the third conductor layer in plan view.

The above production method desirably includes: a step of forming a single crystal semiconductor thin film layer on an upper surface in the third recessed portion; and then, a step of forming the third impurity layer and the third conductor layer in the third recessed portion.

A pillar-shaped semiconductor device according to another aspect of the present invention includes, in a static random access memory (SRAM) cell circuit including a surrounding gate transistor (SGT) including a first semiconductor pillar that stands on a substrate in a vertical direction, a second semiconductor pillar that stands adjacent to the first semiconductor pillar, a gate insulating layer that has an upper surface positioned lower than top surfaces of the first semiconductor pillar and the second semiconductor pillar and that surrounds the first semiconductor pillar and the second semiconductor pillar, and a gate conductor layer that surrounds the gate insulating layer: a first interlayer insulating layer on the gate conductor layer; a first impurity layer which covers a top portion of the first semiconductor pillar and whose outer periphery is equally spaced with an outer periphery of the first semiconductor pillar in plan view; a second impurity layer which covers a top portion of the second semiconductor pillar and whose outer periphery is equally spaced with an outer periphery of the second semiconductor pillar in plan view; a first conductor layer on the first impurity layer; a second conductor layer on the second impurity layer; a second interlayer insulating layer at outer peripheries of the first impurity layer, the second impurity layer, the first conductor layer, and the second conductor layer; a first hand-shaped contact hole that is present in the second interlayer insulating layer and is partly connected to the first conductor layer and the second conductor layer and that connects the first conductor layer and the second conductor layer in plan view; and a first wiring conductor layer connected to the first conductor layer and the second conductor layer such that the first band-shaped contact hole is filled with the first wiring conductor layer, wherein another semiconductor pillar different from the first semiconductor pillar and the second semiconductor pillar is not present in plan view in a region that overlaps the first band-shaped contact hole, the first impurity layer and the second impurity layer are impurity layers of a load SGT in the SRAM cell circuit, and regions of the first conductor layer and the second conductor layer partly protrude outward from the first band-shaped contact hole in plan view.

The above pillar-shaped semiconductor device desirably includes: a third impurity layer that is connected to the first impurity layer and the second impurity layer and has a region extending on the same surface and that contains the first impurity layer and the second impurity layer; and a third conductor layer on the third impurity layer, wherein the first band-shaped contact hole is present inside the third impurity layer in plan view.

The above pillar-shaped semiconductor device desirably includes a single crystal semiconductor thin film layer between a side surface of a third recessed portion and the third impurity layer.

In the above pillar-shaped semiconductor device, the first conductor layer and the second conductor layer are desirably formed of a metal, an alloy, or a semiconductor containing a large amount of donor or acceptor impurity atoms and desirably have a single-layer structure or a multi layer structure.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1AA, 1AB and 1AC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1BA, 1BB and 1BC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1CA, 1CB and 1CC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1DA, 1DB and 1DC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1EA, 1EB and 1EC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1FA, 1FB and 1FC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1GA, 1GB and 1GC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1HA, 1HB and 1HC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1IA, 1IB and 1IC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1JA, 1JB and 1JC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1KA, 1KB and 1KC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1LA, 1LB and 1LC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1MA, 1MB and 1MC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1NA, 1NB and 1NC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1OA, 1OB and 1OC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1PA, 1PB and 1PC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1QA, 1QB and 1QC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1RA1RB and 1RC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1SA, 1SB and 1SC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 1TA, 1TB and 1TC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a first embodiment.

FIGS. 2AA, 2AB and 2AC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a second embodiment of the present invention.

FIGS. 2BA, 2BB and 2BC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a second embodiment of the present invention.

FIGS. 2CA, 2CB and 2CC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a second embodiment of the present invention.

FIGS. 2DA, 2DB and 2DC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a second embodiment of the present invention.

FIGS. 2EA, 2EB and 2EC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a second embodiment of the present invention.

FIGS. 2FA, 2FB and 2FC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a second embodiment of the present invention.

FIGS. 2GA, 2GB 2GC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a second embodiment of the present invention.

FIGS. 3AA, 3AB and 3AC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a third embodiment of the present invention.

FIGS. 3BA, 3BB and 3BC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a third embodiment of the present invention.

FIGS. 3CA, 3CB and 3CC are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a third embodiment of the present invention.

FIGS. 4A, 4B and 4C are a plan view and sectional structural views for describing a method for producing a pillar-shaped semiconductor device including SGTs according to a fourth embodiment of the present invention.

FIGS. 5A and 5B are schematic structural views illustrating an SGT in the related art.

FIG. 6 illustrates an SRAM cell circuit including SGTs in the related art.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Hereafter, a method for producing a pillar-shaped semiconductor device according to embodiments of the present invention will be described with reference to the attached drawings.

First Embodiment

Hereafter, a method for producing an SRAM cell circuit including SGTs according to a first embodiment of the present invention will be described with reference to FIG. 1AA to FIG. 1TC. Among FIG. 1AA to FIG. 1TC, figures suffixed with A are plan views, figures suffixed with B are sectional structural views taken along lines X-X′ in the corresponding figures suffixed with A, and figures suffixed with C are sectional structural views taken along lines Y-Y′ in the corresponding figures suffixed with A.

As illustrated in FIGS. 1AA to 1AC, an N layer 2 is formed on a P layer substrate 1 by epitaxial growth. An N⁺ layer 3 and P⁺ layers 4 a and 4 b are formed in a top layer of the N layer 2 by ion implantation. Then, an i layer 6 is formed. A mask material layer 7 formed of, for example, a SiO₂ layer, an aluminum oxide (Al₂O₃, hereafter referred to as AlO) layer, and a SiO₂ layer is formed. A silicon germanium (Site) layer 8 is deposited. A mask material layer 9 formed of a SiO₂ layer is deposited. A mask material layer 10 formed of a SiN layer is deposited. The i layer 6 may be formed of N-type or P-type Si containing donor or acceptor impurity atoms in a small amount.

Next, the mask material layer 10 is etched using, as a mask, a band-shaped resist layer (not illustrated) that is formed by lithography so as to extend in a Y direction in plan view. Thus, a band-shaped mask material layer (not illustrated) that extends in the Y direction in plan view is formed. The band-shaped mask material layer is subjected to isotropic etching using a resist layer as a mask so as to have a width smaller than that of the resist layer. Thus, band-shaped mask material layers 10 a and 10 b each having a width smaller than the minimum width of the resist layer that can be formed by lithography are formed. The mask material layer 9 is etched by, for example, RIE (Reactive Ion Etching) using the band-shaped mask material layers 10 a and 10 b as etching masks to form band-shaped mask material layers 9 a and 9 b. Each section of the band-shaped mask material layers 10 a and 10 b formed by isotropic etching has a trapezoidal shape in which the bottom has a larger width than the top whereas each section of the band-shaped mask material layers 9 a and 9 b has a rectangular shape because of RIE. This rectangular section leads to an improvement in the precision of an etching pattern formed using the band-shaped mask material layers 9 a and 9 b as masks. Then, the SiGe layer 8 is etched by, for example, RIE using the band-shaped mask material layers 9 a and 9 b as masks to form band-shaped SiGe layers 8 a and 8 b as illustrated in FIGS. 1BA to 1BC. The band-shaped mask material layers 10 a and 10 b on the band-shaped mask material layers 9 a and 9 b may be removed before etching of the SiGe layer 8 or may be left.

Next, a SiN layer (not illustrated) is entirely formed by ALD (Atomic Layered Deposition) so as to cover the mask material layer 7, the band-shaped SiGe layers 8 a and 8 b, and the band-shaped mask material layers 9 a and 9 b. In this case, the section of the SiN layer 12 is rounded at the top. The rounded portions are desirably formed at positions higher than those of the band-shaped mask material layers 9 a and 9 b. A SiO₂ layer (not illustrated) is entirely deposited by, for example, flow CVD (Flow Chemical Vapor Deposition). The SiO₂ layer and the SiN layer are polished by CND (Chemical Mechanical Polishing) so as to have upper surfaces that are flush with those of the band-shaped mask material layers 9 a and 9 b. Thus, SiN layers 13 a, 13 b, and 13 c are formed. The top portions of the SiN layers 13 a, 13 b, and 13 c are etched to form recessed portions. This etching is performed such that the bottoms of the recessed portions are positioned lower than the band-shaped mask material layers 9 a and 9 b. A SiN layer (not illustrated) is entirely deposited, and the SiN layer is entirely polished by CMP so as to have an upper surface that is flush with those of the mask. material layers 9 a and 9 b. The SiO₂ layer formed by flow CAT) is removed. Thus, as illustrated in FIGS. 1CA to 1CC, band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb having the same shape as the top portions of the SiN layers 13 a, 13 b, and 13 c in plan view are formed on both sides of the band-shaped mask material layers 9 a and 9 b.

Next, as illustrated in FIGS. 1DA to 1DC, the SiN layers 13 a, 13 b, and 13 c are etched using the band-shaped mask material layers 9 a, 9 b, 12 aa, 12 ab, 12 ba, and 12 bb as masks to form band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb. In this case, the band-shaped SIN layers 13 aa, 13 ab, 13 ba, and 13 bb have the same width in plan view.

Next, the band-shaped mask material layers 9 a and 9 b and the band-shaped SiGe layers 8 a and 8 b are removed. Thus, as illustrated in FIGS. 1EA to 1EC, the band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb on which the band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb are formed and which extend in the Y direction so as to be parallel with each other in plan view are formed on the mask material layer 7.

Next, a SiO₂ layer (not illustrated) is entirely deposited by FCVD. The SiO₂ layer is polished by CMP so as to have an upper surface that is flush with those of the band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb. Thus, as illustrated in FIGS. 1FA to 1FC, a SiO₂ layer 15 is formed. A SiN layer 16 is formed on the SiO₂ layer 15 and the band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb. Band-shaped mask material layers 17 a and 17 b that extend in an X direction so as to be parallel with each other are formed on the SiN layer 16 by the same fundamental method as that for forming the band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb.

Next, as illustrated in FIGS. 1GA to 1GC, the SiN layer 16, the band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb, the band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb, and the mask material layer 7 are etched by RIE using the band-shaped mask material layers 17 a and 17 b as masks. The remaining SiN layer 16 and SiO₂ layer 15 are removed. This results in formation of SiN pillars 20 a, 20 b, 20 c, 20 d, 20 e, 20 f, 20 g, and 20 h on which mask material layers 19 a, 19 b, 19 c, 19 d, 19 e, 19 f, 19 g, and 19 h each having a rectangular shape in plan view are formed.

Next, as illustrated in FIGS. 1HA to 1HC, the rectangular mask material layers 19 b and 19 g and the SiN pillars 20 b and 20 g are removed.

Next, the mask material layer 7 is etched using the mask material layers 19 a, 19 c, 19 d, 19 e, 19 f, and 19 h and the SiN pillars 20 a, 20 c, 20 d, 20 e, 20 f, and 20 h as masks to form mask material layers 7 a, 7 b, 7 c, 7 d, 7 e, and 7 f as illustrated in FIGS. 1IA to 1IC. Herein, isotropic etching is performed by, for example, CDE (Chemical Dry Etching) such that the mask material layers 7 a, 7 b, 7 c, 7 d, 7 e, and 7 f each have a circular shape in plan view. This CDE is not performed when the mask material layers 7 a, 7 b, 7 c, 7 d, 7 e, and 7 f each have a circular shape before this process. The mask material layers 19 a, 19 c, 19 d, 19 e, 19 f, and 19 h and the SiN pillars 20 a, 20 c, 20 d, 20 e, 20 f, and 20 h are removed. The i layer 6 is etched using the mask material layers 7 a, 7 b, 7 c, 7 d, 7 e, and 7 f as masks to form Si pillars 6 a, 6 b, 6 c, 6 d, 6 e, and 6 f on the N⁺ layer 3 and the P⁺ layers 4 a and 4 b.

Next, as illustrated in FIGS. 1JA to 1JC, the layer 3, the P⁺ layer 4 a, the N layer 2, and the P layer substrate 1 connected to the bottom portions of the Si pillars 6 a, 6 b, and 6 c are etched to form a Si pillar base 21 a constituted by an upper portion of the P layer substrate 1, the N layer 2 a, the N⁺ layers 3 aa and 3 ab, and the P⁺ layer 4 aa. At the same time, the N⁺ layer 3, the P⁺ layer 4 b, the N layer 2, and the P layer substrate 1 connected to the bottom portions of the Si pillars 6 d, 6 e, and 6 f are etched to form a Si pillar base 21 b constituted by an upper portion of the P layer substrate 1, the N layer 2 b, the N⁺ layers 3 ba (not illustrated) and 3 bb (not illustrated), and the P⁺ layer 4 bb. A SiO₂ layer 22 is formed on the P layer substrate 1 and at the outer peripheries of the N⁺ layers 3 aa, 3 ab, 3 ba, and 3 bb, the P⁺ layers 4 aa and 4 bb, and the N layers 2 a and 2 b. A HfO₂ layer 23 and TiN layers (not illustrated) are entirely deposited by ALD. In this case, the side surfaces of the TiN layers are in contact with each other between the Si pillars 6 b and 6 c and between the Si pillars 6 d and 6 e. A TiN layer 24 a is formed on the HfO₂ layer 23 that surrounds the outer periphery of the Si pillar 6 a, a TiN layer 24 b is formed so as to surround the HfO₂ layer 23 on the outer peripheries of the Si pillars 6 b and 6 c, a TiN layer 24 c is formed so as to surround the HfO₂ layer 23 on the outer peripheries of the Si pillars 6 d and 6 e, and a TiN layer 24 d is formed so as to surround the HfO₂ layer 23 on the outer periphery of the Si pillar 6 f. A SiO₂ layer (not illustrated) is entirely deposited and then entirely polished by CMP so as to have an upper surface that is flush with those of the mask material layers 7 a, 7 b, 7 c, 7 d, 7 e, and 7 f The SiO₂ layer (not illustrated) planarized by RIE is etched back to form a SiO₂ layer 25. Top portions of the HfO₂, layer 23 and the TiN layers 24 a, 24 b, 24 c, and 24 d are removed using the mask material layers 7 a, 7 b, 7 c, 7 d, 7 e, and 7 f and the SiO₂ layer 25 as masks. The TiN layers 24 a, 24 b, 24 c, and 24 d serve as gate conductor layers of SGTs. The gate conductor layers are layers that contribute to setting of the threshold voltage of an SGT and may be formed of a gate conductor material layer having a single-layer structure or a multilayer structure. The gate conductor material layers are formed in contact with the entire side surfaces between the Si pillars 6 b and 6 c and between the Si pillars 6 d and 6 e. Herein, for example, a tungsten (W) layer is formed so as to be connected to the gate conductor material layer, and the W layer may be used as a wiring conductor layer. The W layer may be another conductor material layer.

Next, as illustrated in FIGS. 1KA to 1KC, a SiN layer 27 is formed on the SiO₂ layer 25 formed at the outer peripheries of the Si pillars 6 a to 6 f. A SiO₂ layer (not illustrated) is entirely deposited. The SiO₂ layer is etched by RIE to form SiO₂ layers 28 a, 28 b, 28 c, 28 d, 28 e, and 28 f with an equal width in plan view on the side surfaces of the exposed top portions of the Si pillars 6 a to 6 f and the mask material layers 7 a to 7 f. In this case, the SiO₂ layer 28 b and the SiO₂ layer 28 c are formed apart from each other. Similarly, the SiO₂ layer 28 d and the SiO₂ layer 28 e are formed apart from each other.

Next, a SiN layer (not illustrated) is entirely deposited. As illustrated in FIGS. 1LA to 1LC, the SiN layer is polished by CMP so as to have an upper surface that is flush with those of the mask material layers 7 a to 7 f. Thus, a SiN layer 29 is formed. The SiO₂ layers 28 a, 28 b, 28 c, 28 d, 28 e, and 28 f that surround the top portions of the Si pillars 6 a to 6 f are removed to form recessed portions 30 a, 30 b, 30 c, 30 d, 30 e, and 30 f that surround the top portions of the Si pillars 6 a to 6 f. Since the SiO₂ layers 28 a, 28 b, 28 c, 28 d, 28 e, and 28 f are formed in a self-aligned manner with the Si pillars 6 a to 6 f, the recessed portions 30 a, 30 b, 30 c, 30 d, 30 e, and 30 f are formed in a self-aligned manner with the Si pillars 6 a to 6 f.

Next, as illustrated in FIGS. 1MA to 1MC, the mask material layers 7 a, 7 b, 7 c, 7 d, 7 e, and 7 f are removed to form recessed portions 30A, 30B, 30C, 30D, 30E, and 30F around and on the top portions of the Si pillars 6 a to 6 f.

Next, a SiO₂ layer (not illustrated) is entirely deposited by CVD. As illustrated in FIGS. 1NA to 1NC, the SiO₂ layer is polished by CMP until the upper surface of the SiO₂ layer reaches the upper surface of the SiN layer 29. Thus, SiO₂ layers 31 a, 31 b (not illustrated), 31 c, 31 d, 31 e (not illustrated), and 31 f are formed in the recessed portions 30A, 30B, 30C, 30D, 30E, and 30F so as to cover the top portions of the Si pillars 6 a to 6 f. The SiO₂ layers 31 b and 31 e are removed by lithography and chemical etching. P⁺ layers 32 b and 32 e containing acceptor impurities are formed by selective epitaxial growth in the recessed portions 30B and 30E so as to cover the top portions of the Si pillars 6 b and 6 e. The P⁺ layers 32 b and 32 e are formed such that the outer peripheries of the layers 32 b and 32 e are present inside the outer peripheries of the recessed portions 30B and 30E in plan view. Herein, before formation of the P⁺ layers 32 b and 32 e, damaged surface layers in the top portions of the Si pillars 6 b and 6 e are desirably removed and cleaned by thinly oxidizing the top portions of the Si pillars 6 b and 6 e and then removing the oxide films. For the P⁺ layers 32 b and 32 e, single crystal P⁺ layers 32 b and 32 e may be formed by a method other than the selective epitaxial growth, such as molecular beam epitaxy. Alternatively, the P⁺ layers 32 b and 32 e may be formed by entirely depositing a semiconductor layer containing acceptor impurities, polishing the semiconductor layer by CMP until the upper surface reaches the upper surface of the SiN layer 29, and then performing CDE or chemical etching on the upper surface.

Next, a SiO₂ layer (not illustrated) is entirely deposited. The SiO₂ layer is polished by CMP so as to have an upper surface that is flush with that of the SiN layer 29. Thus, the SiO₂ layer (not illustrated) covers the P⁺ layers 32 b and 32 e. The SiO₂ layers 31 a, 31 c, 31 d, and 31 f are removed by lithography and chemical etching. As illustrated in FIGS. 1OA to 1OC, N⁺ layers 32 a, 32 c, 32 d, and 32 f containing donor impurities are formed by selective epitaxial growth in the recessed portions 30A, 30C, 30D, and 30F so as to cover the top portions of the Si pillars 6 a, 6 c, 6 d, and 6 f. The N⁺ layers 32 a, 32 c, 32 d, and 32 f are formed such that the outer peripheries of the N⁺ layers 32 a, 32 c, 32 d, and 32 f are present inside the outer peripheries of the recessed portions 30A, 30C, 30D, and 30F in plan view. The SiO₂ layer on the P⁺ layers 32 b and 32 e is removed.

Next, a thin Ta layer (not illustrated) and a W layer (not illustrated) are entirely deposited. As illustrated in FIGS. 1PA to 1PC, the W layer is polished by CMP so as to have an upper surface that is flush with that of the SiN layer 29 to form W layers 33 a, 33 b, 33 c, 33 d, 33 e, and 33 f. In this case, the Ta layer present between the N⁺ layers 32 a, 32 c, 32 d, and 32 f and the P⁺ layers 32 b and 32 e, and the W layers 33 a, 33 b, 33 c, 33 d, 33 e, and 33 f is a buffer layer for decreasing the contact resistance between the two layers. The buffer layer may be another material layer having a single-layer structure or a multilayer structure.

Next, as illustrated in FIGS. 1QA to 1QC, a contact hole C1 is formed on the TiN layer 24 c, the N⁺ layer 3 aa, and the P⁺ layer 4 aa. At the same time, a contact hole C2 is formed on the TiN layer 24 b, the N⁺ layer 3 bb, and the P⁺ layer 4 bb. A thin buffer Ti layer (not illustrated) and a W layer (not illustrated) are entirely deposited. The W layer is etched back by RIE so as to have an upper surface positioned lower than the upper surfaces of the contact holes C1 and C2. Thus, W layers 34 a (not illustrated) and 34 b are formed in the contact holes C1 and C2. A SiN layer (not illustrated) is entirely deposited. The SiN layer is polished by CMP so as to have an upper surface that is flush with those of the W layers 33 a, 33 b, 33 c, 33 d, and 33 f. Thus, SiN layers 35 a (not illustrated) and 35 b are formed on the W layer 34 a in the contact hole C1 and on the W layer 34 b in the contact hole C2, respectively.

Next, a SiO₂ layer (not illustrated) is entirely deposited. As illustrated in FIGS. 1RA to 1RC, after a SiO₂ layer 37 is entirely formed, a band-shaped contact hole C3 that at least partly overlaps the W layers 33 b and 33 e on the Si pillars 6 b and 6 e in plan view and that extends in the Y direction is formed by lithography and RIE. The bottom of the band-shaped contact hole C3 may reach the upper surface of the SiN layer 27.

Next, as illustrated in FIGS. 1SA to 1SC, the band-shaped contact hole C3 is filled with a power supply wiring metal layer Vdd that connects the W layers 33 b and 33 e to each other. The power supply wiring metal layer Vdd may be formed by using a material layer that is formed of a metal, an alloy, or a semiconductor containing a large amount of donor or acceptor impurities and that has a single-layer structure or a multilayer structure.

Next, as illustrated in FIGS. 1TA to 1TC, a SiO₂ layer 38 having a flat upper surface is entirely formed. A ground wiring metal layer Vss1 is formed through a contact hole C4 formed on the W layer 33 c present on the N⁺ layer 32 c. At the same time, a ground wiring metal layer Vss2 is formed through a contact hole C5 formed on the W layer 33 d present on the N⁺ layer 32 d. A SiO₂ layer 39 having a flat upper surface is entirely formed. A word wiring metal layer WL is formed through contact holes C6 and C7 formed on the TiN layers 24 a and 24 d. A SiO₂ layer 40 having a flat upper surface is entirely formed. An inverted bit output wiring metal layer RBL and a bit output wiring metal layer BL are formed through contact holes C8 and C9 formed on the W layers 33 a and 33 f present on the N⁺ layers 32 a and 32 f. Thus, an SRAM cell circuit is formed on the P layer substrate 1. In this SRAM circuit, load SGTs are formed at the Si pillars 6 b and 6 e, drive SGTs are formed at the Si pillars 6 c and 6 d, and selection SGTs are formed at the Si pillars 6 a and 6 f.

Through the heating process after formation of the N⁺ layers 32 a, 32 c 32 d, and 32 f and the P⁺ layers 32 b and 32 e illustrated in FIGS. 1NA to 1NC and FIGS. 1OA to 1OC, donor or acceptor impurities diffuse from the N⁺ layers 32 a, 32 c, 32 d, and 32 f and the P⁺ layers 32 b and 32 e to the top portions of the Si pillars 6 a to 6 f, thereby forming N⁺ layers 32A, 32C, 32D, and 32F (not illustrated) and P⁺ layers 32B and 32E (not illustrated). The distribution shape of the N⁺ layers 32A, 32C, 32D, and 32F and the P⁺ layers 32B and 32E is a surface layer of the top portion or an entire top portion of the Si pillars 6 a to 6 f, depending on the history of the heating process and the diameter of the Si pillars 6 a to 6 f. Consequently, the N ⁺ layers 32 a, 32 c, 32 d, and 32 f, the P⁺ layers 32 b and 32 e, the N⁺ layers 32A, 32C, 32D, and 32F, and the P⁺ layers 32B and 32E are formed so as to be connected to the top portions of the Si pillars 6 a to 6 f. The lower ends of the N⁺ layers 32A, 32C, 32D, and 32F and the P⁺ layers 32B and 32E in a vertical direction may be flush with the upper ends of the gate TiN layers 24 a, 24 b, 24 c, and 24 d or may be away from or overlap the gate TiN layers 24 a, 24 b, 24 c, and 24 d as long as a normal SGT operation is performed.

At the stage illustrated in FIGS. 1JA to 1JC, the mask material layers 7 a, 7 b, 7 c, 7 d, 7 e, and 7 f are not necessarily present. In this case, at the stage illustrated in FIGS. 1KA to 1KC or FIGS. 1LA to 1LC, the upper surfaces of the top portions of the Si pillars 6 a to 6 f can be made lower than that of the SiN layer 29 by, for example, etching the top portions of the Si pillars 6 a. to 6 f or oxidizing and then removing the top portions of the Si pillars 6 a to 6 f.

The formation of the band-shaped contact hole C3 requires the following conditions.

(Condition 1)

There is no Si (corresponding to 6 a, 6 c, 6 d, and 6 f in this embodiment) other than load SGTs in a region of the band-shaped contact hole C3 in plan view.

(Condition 2)

In the entire band-shaped region in which the band-shaped contact hole C3 is formed, the power supply wiring metal layer Vdd serving as a conductor layer is entirely formed from the upper surface to the bottom of the band-shaped contact hole C3. Therefore, the wiring metal layer (corresponding to the word wiring metal layer WL in this embodiment) that intersects the band-shaped contact hole C3 in plan view needs to be formed at a position higher than that of the band-shaped contact hole C3 in a vertical direction to prevent an electrical short circuit with the power supply wiring metal layer Vdd.

(Condition 3)

When viewed in plan, the band-shaped contact hole C3 may be formed so as to be connected to another adjacent SRAM cell in the Y direction or may be formed so as to be separated from the other SRAM cell. However, when viewed in plan, the Si pillars (corresponding to the Si pillars 6 b and 6 c in this embodiment) that constitute load SGTs need to be connected to each other in both the X direction and the Y direction.

(Condition 4)

The band-shaped contact hole C3 is formed to establish a connection between the impurity region (corresponding to the P⁺ layers 32 b and 32 e in this embodiment) serving as a source or drain of an SGT and connected to the top portion of a Si pillar and a wiring conductive layer formed of a metal, an alloy, or the like.

The production method according to the first embodiment provides the following features.

(Feature 1)

In the related art, contact holes are independently formed on the Si pillars 6 b and 6 e at which load SGTs are formed. The distance between the two contact holes is shorter than the distance between contact holes at drive SGTs or selection SGTs. In this case, an increase in the degree of integration of SRAM cells makes it difficult to form the two independent contact holes through a single process of lithography and RIE. Therefore, for example, a process of lithography and RIE needs to be performed twice. This case poses problems such as an increase in cost due to an increase in the number of steps and a decrease in the degree of integration due to introduction of margins for mask alignment between two lithography processes. This case also poses production difficulties of precisely forming two adjacent minute contact holes that are independent of each other. In contrast, in this embodiment, the band-shaped contact hole C3 is formed so as to overlap, in plan view, the P⁺ layers 32 b and 32 e and the W layers 33 b and 33 e above the two Si pillars 6 b and be at which load SGTs are formed. Thus, the power supply wiring metal layer Vdd is connected to the P⁺ layers 32 b and 32 e through the band-shaped contact hole C3. In this embodiment, independent contact holes are not formed above the Si pillars 6 b and 6 e. This can decrease the cost because of formation of a contact hole through a single process of lithography and RIE and can prevent a decrease in the degree of integration because there is no need to ensure margins for mask alignment. Furthermore, the band-shaped contact hole C3 can be formed in a large area compared with the known method in which two independent contact holes are formed, which can improve the precision of patterns. Thus, an SRAM cell including SGTs with a high degree of integration and high precision is formed at low cost in this embodiment.

(Feature 2)

The contact holes C4 and C5 are formed so as to be adjacent to the band-shaped contact hole C3. If the Si pillars 6 b and 6 c and the Si pillars 6 d and 6 e are formed with a high density, the distance between the band-shaped contact hole C3 and the contact holes C4 and C5 decreases, which makes it easy to cause an electrical short circuit between the power supply wiring metal layer Vdd and the ground wiring metal layers Vss1 and Vss2. In contrast, in this embodiment, the P⁺ layers 32 b and 32 d and the W layers 33 b and 33 d covering the P layers 32 b and 32 d and having a low resistance are formed in the recessed portions 30B and 30E that are formed by removing the SiO₂ layers 28 b, 28 c, 28 d, and 28 e formed through self-alignment. Therefore, it is sufficient that the band-shaped contact hole C3 is formed so as to overlap a part of the W layers 33 b and 33 d in plan view. As a result, the band-shaped contact hole C3 and the contact holes C4 and C5 can be formed without decreasing the degree of integration of SRAM cells.

In this embodiment, formation of one SRAM cell constituted by six SGTs has been described. Even in an SRAM cell in which the number of SGTs is anything other than six, the same effects are produced as long as the above conditions are satisfied. Furthermore, in the formation of logic elements constituted by a plurality of SGTs, the production method according to this embodiment can also be applied to formation of circuits in which impurity layers connected to the top portions of adjacent semiconductor pillars at which SGTs are formed are connected to each other. This increases the degree of integration of logic circuits.

Second Embodiment

Hereafter, a method for producing an SRAM cell circuit including SGTs according to a second embodiment of the present invention will be described with reference to FIG. 2AA to FIG. 2GC. Among FIG. 2AA to FIG. 2GC, figures suffixed with A are plan views, figures suffixed with B are sectional structural views taken along lines X-X′ in the corresponding figures suffixed with A, and figures suffixed with C are sectional structural views taken along lines Y-Y′ in the corresponding figures suffixed with A.

The processes in FIG. 1AA to FIG. 1QC are performed. A resist layer (not illustrated) is entirely deposited. As illustrated in FIGS. 2AA to 2AC, a resist layer 42 having a band-shaped window that overlaps the Si pillars 6 b and 6 e in plan view is formed on the SiN layer 41, the mask material layers 7 a to 7 f, and the SiO₂ layers 28 a to 28 f by lithography.

Next, as illustrated in FIGS. 2BA to 2BC, the SiN layer 41, the mask material layers 7 b and 7 e, and the SiO₂ layers 28 b and 28 e are etched by RIE using the resist layer 42 as a mask so as to have upper surfaces positioned lower than the upper surfaces of the top portions of the Si pillars 6 b and 6 e. Thus, a recessed portion 43 is formed. The bottom of the recessed portion 43 may reach the SiN layer 27.

Next, the resist layer 42 is removed. As illustrated in FIGS. 2CA to 2CC, the mask material layers 7 b and 7 e and the SiO₂ layers 28 b and 28 e on the Si pillars 6 b and 6 e are removed to form a recessed portion 43A. The recessed portion 43A is constituted by a rectangular portion that extends in the Y direction and portions of the SiO₂ layers 28 b and 28 e that have been removed, the portions surrounding the top portions of the Si pillars 6 b and 6 e.

Next, a thin Si layer (not illustrated) is entirely deposited by ALD and a P⁺ layer (not illustrated) containing acceptor impurities is entirely deposited by epitaxial growth. The P⁺ layer and the thin Si layer are polished so as to have upper surfaces that are flush with that of the SiN layer 41. Thus, a thin Si layer 45 and a P⁺ layer 46 are formed as illustrated in FIGS. 2DA to 2DC.

Next, as illustrated in FIGS. 2EA to 2EC, the thin Si layer 45 and an upper portion of the P⁺ layer 46 are etched to form a P⁺ layer 46 b. A mask material layer 49 b that is present on the P⁺ layer 46 b and that has an upper surface flush with that of the SiN layer 41 is formed by CVD and CMP. The mask material layers 7 a, 7 c, 7 d, and 7 f on the top portions of the Si pillars 6 a, 6 c, 6 d, and 6 f and the SiO₂ layers 28 a, 28 c, 28 d, and 28 f at the outer peripheries of the top portions of the Si pillars 6 a, 6 c, 6 d, and 6 f are removed to form recessed portions 43A, 43C, 43D, and 43E on the top portions of the Si pillars 6 a, 6 c, 6 d, and 6 f. The P⁺ layer 46 b may be formed by selective epitaxial growth as in the first embodiment. Alternatively, a single crystal P⁺ layer 46 b may be formed by another method such as molecular beam epitaxy.

Next, as illustrated in FIGS. 2FA to 2FC, thin Si layers 45 a, 45 c (not illustrated), 45 d, and 45 e (not illustrated) and N⁺ layers 46 a, 46 c, 46 d (not illustrated), and 46 e (not illustrated) containing donor impurities are formed in the recessed portions 43A, 43C, 43D, and 43E by the same method as that for forming the P⁺ layer 46 b. Mask material layers 49 a, 49 c, 49 d, and 49 e are formed on the N⁺ layers 46 a, 46 c, 46 d, and 46 e so as to have upper surfaces that are flush with that of the SiN layer 41.

Next, the mask material layers 49 a, 49 b, 49 c, 49 d, and 49 e are removed. As illustrated in FIGS. 2GA to 2GC, W layers 50 a, 50 b, 50 c, 50 d, and 50 e are formed on the N⁺ layers 46 a, 46 c, 46 d, and 46 e and the P⁺ layers 46 b and 46 e by CVD and CMP. A SiO₂ layer 52 is entirely formed. A band-shaped contact hole C10 is formed by removing a part of the SiO₂ layer 52 on the W layer 50 b using lithography and RIE. A band-shaped power supply wiring metal layer VDD connected to the W layer 50 b is formed through the band-shaped contact hole C10. By performing the process illustrated in FIGS. 1TA to 1TC, an SRAM cell circuit is formed on the P layer substrate 1. The W layers 50 a, 50 b, 50 c, 50 d, and 50 e may be conductor layers formed of another metal or an alloy and having a single-layer structure or a multilayer structure.

As in the first embodiment, impurity layers containing donor impurity atoms may be formed in the top portions of the Si pillars 6 a, 6 c, 6 d, and 6 f below the thin Si layer, and impurity layers containing acceptor impurity atoms may be formed in the top portions of the Si pillars 6 b and 6 e. These impurity layers may be formed through thermal diffusion of acceptor impurity atoms and donor impurity atoms from the P⁺ layer 46 b and the N⁺ layers 46 a, 46 c, 46 d, and 46 e after formation of the thin Si layers 45 a to 45 f. For these impurity layers, the P⁺ layer 46 b and the N⁺ layers 46 a, 46 c, 46 d, and 46 e may be formed by introducing acceptor impurity atoms and donor impurity atoms to the top portions of the Si pillars 6 a to 6 f before formation of the thin Si layers 45 a to 45 f.

The production method according to the second embodiment provides the following features.

(Feature 1)

In the first embodiment, the P⁺ layers 32 b and 32 e are formed by selective epitaxial growth in the recessed portions 30B and 30E at the outer peripheries of the top portions of the Si pillars 6 b and 6 e. The P⁺ layers 32 b and 32 e in contact with the top portions of the Si pillars 6 b and 6 e need to have good crystallinity. Poor crystallinity poses a problem such as an increase in the resistance of diodes due to the P⁺ layers 32 b and 32 e, an increase in the leak current, or a decrease in the withstanding voltage of junctions. To improve the crystallinity, the areas of the recessed portions 30B and 30E in which crystal growth is performed in plan view need to be increased. However, since the areas of the recessed portions 30B and 30E are decreased by increasing the density of the SRAM cell, it is difficult to form P⁺ layers 32 b and 32 e having good crystallinity. In contrast, in this embodiment, the area of the recessed portion 43A in which epitaxial growth is performed is larger than those of the recessed portions 30B and 30E in the first embodiment. Therefore, a P⁺ layer 46 having good crystallinity can be formed. This decreases the diode resistance and the leak current and increases the withstanding voltage.

(Feature 2)

in this embodiment, the P⁺ layer 46 b and the N⁺ layers 46 a, 46 c, 46 d, and 46 e include impurity regions that concentrically surround the top portions of the Si pillars 6 a to 6 f through self-alignment. This shortens the distance between the two adjacent Si pillars 6 b and 6 c and the distance between the two adjacent Si pillars 6 d and 6 e, which further increases the density of the SRAM cell. Similarly, the W layers 50 a to 50 e on the P⁺ layer 46 b and the N⁺ layers 46 a, 46 c, 16 d, and 46 e are formed in the recessed portions 43A to 43E formed through self-alignment. Thus, the contact hole C10 for connecting the W layer 50 b and the power supply wiring metal layer VDD can be separated from the W layers 50 a, 50 c, 50 d, and 50 e on the adjacent Si pillars 6 a, 6 c, 6 d, and 6 f. This increases the density of the SRAM cell.

Third Embodiment

Hereafter, a method for producing an SRAM cell circuit including SGTs according to a third embodiment of the present invention will be described with reference to FIG. 3AA to FIG. 3CC. Among FIG. 3AA to FIG. 3CC, figures suffixed with A are plan views, figures suffixed with B are sectional structural views taken along lines X-X′ in the corresponding figures suffixed with A, and figures suffixed with C are sectional structural views taken along lines Y-Y′ in the corresponding figures suffixed with A.

As illustrated in FIGS. 3AA to 3AC, a Si pillar base 55 a constituted by an N layer 2A, N⁺ layers 3Aa and 3Ab, and a P⁺ layer 4Aa and a Si pillar base 55 b constituted by an N layer 2B, N⁺ layers 3Ba (not illustrated) and 3Bb (not illustrated), and a P⁺ layer 4Ba are formed on the P layer substrate 1. Si pillars 6A, 6B, 6C, 6D, 6F, and 6F are formed on the Si pillar bases 55 a and 55 b. A straight line connecting the centers of the Si pillars 6B and 6E extends in a Y direction. Similarly, a straight line connecting the centers of the Si pillars 6A and 6D and a straight line connecting the centers of the Si pillars 6C and 6F also extend in the Y direction. A SiO₂ layer 22 a is formed at the outer peripheries of the bottom portions of the Si pillars 6A to 6F. A gate HfO₂ layer 23 a is entirely formed by ALD. A gate TiN layer 24A is formed so as to surround the HfO₂ layer 23 a around the Si pillar 6A. At the same time, a gate TiN layer 24B is formed so as to surround the HfO₂ layer 23 a around the Si pillars 6B and 6C. At the same time, a gate TiN layer 24C is formed so as to surround the HfO₂ layer 23 a around the Si pillars 6D and 6E. At the same time, a gate TiN layer 24D (not illustrated) is formed so as to surround the HfO₂ layer 23 a around the Si pillar 6F. A SiO₂ layer 25 a is formed so as to surround the gate TiN layers 24A, 24B, 24C, and 24D. A W layer 26 a connected to the TiN layer 24C, the N⁺ layer 3Aa, and the P⁺ layer 4Aa through a contact hole Ca formed in the SiO₂ layer 25 a is formed so as to have an upper surface positioned lower than those of the TiN layers 24A to 24D. At the same time, a W layer 26 b connected to the TiN layer 24B, the N⁺ layer 3Bb, and the P⁺ layer 4Ba through a contact hole Cb formed in the SiO₂ layer 25 a is formed so as to have an upper surface positioned lower than those of the TiN layers 24A to 24D. A SiN layer 27 a is formed at the outer peripheries of the top portions of the Si pillars 6A to 6F and on the upper ends of the gate TiN layers 24A to 24D. N⁺ layers 46 a, 46 c, 46 d (not illustrated), and 46 f (not illustrated) and a P⁺ layer 46 b are formed in the top portions of the Si pillars CA, CC, 6D, and 6F. N⁺ layers 47 a, 47 c, 47 d (not illustrated), and 47 f (not illustrated) and layers 47 b and 47 e are formed by selective epitaxial growth.

Next, as illustrated in FIGS. 3BA to 3BC, a SiO₂ layer 49 is entirely formed. A band-shaped contact hole Cc that overlaps the Si pillars 6B and 6E in plan view and extends in the Y direction is formed by lithography and RIE so as to have a bottom positioned lower than the upper surfaces of the P⁺ layers 47 b and 47 e. A power supply wiring metal layer Vdd connected to the layers 47 b and 47 e through the contact hole Cc is formed.

Next, as illustrated in FIGS. 3CA to 3CC, a SiO₂ layer 50 having a flat upper surface is entirely formed. A ground wiring metal layer Vss1 is formed through a contact hole Cd formed on the N⁺ layer 47 a. At the same time, a ground wiring metal layer Vss2 is formed through a contact hole Ce formed on the N⁺ layer 47 f. A SiO₂ layer 51 having a flat upper surface is entirely formed. A word wiring metal layer WL is formed through contact holes Cf and Cg formed on the TiN layers 24A and 24D. A SiO₂ layer 52 having a flat upper surface is entirely formed. A bit output wiring metal layer BL and an inverted bit output wiring metal layer RBL are formed through contact holes Ch and Ci formed on the N⁺ layers 47 c and 47 d. Thus, an SRAM cell circuit is formed on the P layer substrate 1.

The production method according to the third embodiment provides the following feature.

In the first embodiment, the Si pillars 6 b and 6 e are formed in different positions in the X direction. In contrast, in this embodiment, the centers of the Si pillars 6C and 6E are on a single line extending in the Y direction.

Although the arrangement of the Si pillars 6A to 6F in the SRAM cell in this embodiment is different from the arrangement of the Si pillars 6 a to 6 f in the first embodiment, this embodiment has the same features as the first embodiment. In this embodiment, the band-shaped contact hole Cc is formed so as to overlap, in plan view, the P⁺ layers 47 b and 47 e on the two Si pillars 6B and 6E at which load SGTs are formed. Thus, the power supply wiring metal layer Vdd is connected to the P⁺ layers 47 b and 47 e through the band-shaped contact hole Cc. In this embodiment, independent contact holes are not formed on the Si pillars 6B and 6E. This can decrease the cost because of formation of a contact hole through a single process of lithography and RIE and can prevent a decrease in the degree of integration because there is no need to ensure margins for mask alignment. Furthermore, the band-shaped contact hole Cc can be formed in a large area compared with the known method in which two independent contact holes are formed, which can improve the precision of patterns. Thus, an SRAM cell including SGTs with a high degree of integration and high precision is formed at low cost in this embodiment.

Fourth Embodiment

Hereafter, a method for producing an SRAM cell circuit including SGTs according to a fourth embodiment of the present invention will be described with reference to FIGS. 4A to 4C. FIG. 4A is a plan view, FIG. 4B is a sectional structural view taken along line X-X′ in FIG. 4A, and FIG. 4C is a sectional structural view taken along line Y-Y′ in FIG. 4A.

As illustrated in FIGS. 4A to 4C, the contact hole C10 and the power supply wiring metal layer VDD illustrated in FIGS. 2GA to 2GC are not formed. The W layer 50 b serves as the power supply wiring metal layer VDD.

According to the production method in the fourth embodiment, there are no steps of forming the contact hole C10 and forming the power supply wiring metal layer VDD in FIGS. 2GA to 2GC, and thus the production process is simplified.

In the embodiments according to the present invention, one SGT is formed in one semiconductor pillar. The present invention can also be applied to formation of circuits in which two or more SGTs are formed in one semiconductor pillar.

In the first embodiment, the Si pillars 6 a to 6 f are formed. Alternatively, semiconductor pillars made of another semiconductor material may be formed. The same applies to other embodiments according to the present invention.

The N⁺ layers 32 a, 32 c, 32 d, and 32 f and the P³⁰ layers 32 b and 32 e in the first embodiment may each be a Si layer or another semiconductor material layer containing donor or acceptor impurities. The N⁺ layers 32 a, 32 c, 32 d, and 32 f and the P⁺ layers 32 b and 32 e may be different semiconductor material layers. The same applies to other embodiments according to the present invention.

In the first embodiment, the N⁺ layers 32 a, 32 c, 32 d, and 32 f and the P⁺ layers 32 b and 32 e are formed by selective epitaxial growth. The N⁺ layers 32 a, 32 c, 32 d, and 32 f and the P⁺ layers 32 b and 32 e may be selectively formed by another method such as a method in which CDE (Chemical Dry Etching) and typical epitaxial growth are repeatedly performed to form the N⁺ layers 32 a, 32 c, 32 d, and 32 f and the P⁺ layers 32 b and 32 e on the top portions of the Si pillars 6 a to 6 f in the recessed portions 30A to 30F. The same applies to other embodiments according to the present invention.

The SiN layer 27 at the outer peripheries of the Si pillars 6 a to 6 f, the SiO₂ layers 28 a to 28 f formed on the side surfaces of the exposed top portions of the Si pillars 6 a to 6 f and the mask material layers 7 a to 7 f, and the SiN layer 29 that surrounds the SiO₂ layers 28 a to 28 f in the first embodiment may each be another material layer having a single-layer structure or a multilayer structure and containing an organic material or an inorganic material as long as the object of the present invention is achieved. The SiN layer 27 at the outer peripheries of the Si pillars 6 a to 6 f is not necessarily formed at the entire outer peripheries of the Si pillars 6 a to 6 f. The SiN layer 27 may be formed at least on the gate TiN layers 24 a, 24 b, 24 c, and 24 d. The same applies to other embodiments according to the present invention.

In the first embodiment, the mask material layer 7 is formed of a SiO₂ layer, an aluminum oxide (Al₂O₃, hereafter referred to as AlO) layer, and a SiO₂ layer. The mask material layer 7 may be another material layer having a single-layer structure or a multilayer structure and containing an organic material or an inorganic material as long as the object of the present invention is achieved. The same applies to other embodiments according to the present invention.

In the first embodiment, as illustrated in FIGS. 1CA to 1CC and FIGS. 1DA to 1DC, the band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb entirely formed by ALD are formed on both sides of the band-shaped SiGe layers 8 a and 8 b. The band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb and the band-shaped SiGe layers 8 a and 8 b may each be another material layer having a single-layer structure or a multilayer structure and containing an organic material or an inorganic material as long as the object of the present invention is achieved. The same applies to other embodiments according to the present invention.

As described in FIG. 1AA to FIG. 1GC, the band-shaped mask material layers 17 a and 17 b that extend in the X direction so as to be orthogonal to the band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb and the band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb which extend in the Y direction are formed by the same method as that for forming the band-shaped SiN material layers 13 aa, 13 ab, 13 ba, and 13 bb. Thus, the Si pillars 6 a to 6 f are formed with high precision and high density in both the X direction and the Y direction. In the description of this embodiment, the band-shaped mask material layers 17 a and 17 b are formed after formation of the band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb and the band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb. On the other hand, even in the process in which the band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb and the band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb are formed after formation of the band-shaped mask material layers 17 a and 17 b, the Si pillars 6 a to 6 f can be formed with high precision and high density. In the design, if there are margins in the Y direction, the band-shaped mask material layers 17 a and 17 b may be directly formed by lithography and RIE without using this method. If there are margins in the X direction, the band-shaped SiN layers 13 aa, 13 ab, 13 ba, and 13 bb may be directly formed by lithography and RIE without using this method. Furthermore, as long as the performance of the SRAM cell can be satisfied, the band-shaped mask material layers 12 aa, 12 ab, 12 ba, and 12 bb that extend in the X direction and the band-shaped mask material layers 17 a and 17 b may be formed using SADP (Self Aligned Double Patterning, e.g., refer to A. Raley, S. Thibaut, N. Mohanty, K. Subhadeep, S. Nakamura, et al., “Self-aligned quadruple patterning integration using spacer on spacer pitch splitting at the resist level for sub-32 nm pitch applications,” Proc. Of SPIE Vol. 9782, 2016) or SAQP (Self Aligned Quadruple Patterning, e.g., refer to A. Raley, S. Thibaut, N. Mohanty, Subhadeep, S. Nakamura, et al., “Self-aligned quadruple patterning integration using spacer on spacer pitch splitting at the resist level for sub-32 nm pitch applications,” Proc. Of SPIE Vol. 9782, 2016). The same applies to other embodiments according to the present invention.

In the first embodiment, as described in FIGS. 1HA to 1HC and FIGS. 1IA to 1IC, after formation of the SiN pillars 20 a, 20 b, 20 c, 20 d, 20 e, 20 f, 20 g, and 20 h on which the rectangular mask material layers 19 a, 19 b, 19 c, 19 d, 19 e, 19 f, 19 g, and 19 h are formed, the rectangular mask material layers 19 h and 19 g and the SiN pillars 20 b and 20 g are removed. Thus, a contact hole C1, C2 formation region is formed in which Si pillars are not present in regions of the contact holes C1 and C2 in FIGS. 1AA to 1TC in plan view. On the other hand, after Si pillars are formed in a contact hole C1, C2 formation region, the Si pillars are removed to form a contact hole C1, C2 formation region. Alternatively, the contact hole C1, C2 formation region may be formed by a method in which Si pillars are not formed in the regions of the contact holes C1 and C2 by performing a step of forming the band-shaped mask material layers 17 a and 17 b and then removing the band-shaped mask material layers 17 a and 17 b in the contact hole C1, C2 formation region. As described above, a method other than the method described in the first embodiment may be employed. The contact hole C1, C2 formation region may be formed by a method other than the above methods, The same applies to other embodiments according to the present invention.

In the first embodiment, as illustrated in FIGS. 1TA to 1TC, the N⁺ layers 3 aa, 3 ab, 3 ba, and 3 bb and the P⁺ layers 4 aa and 4 bb serving as sources or drains of SGTs are formed below the Si pillars 6 a to 6 f and on the N layers 2 a and 2 b in a connected manner. On the other hand, the N⁺ layers 3 aa, 3 ab, 3 ba, and 3 bb and the P⁺ layers 4 aa and 4 bb may be formed in the bottom portions of the Si pillars 6 a to 6 f, and the N⁺ layers 3 aa, 3 ab, 3 ba, and 3 bb and the P⁺ layers 4 aa and 4 bb may be connected to each other through a metal layer or an alloy layer. Alternatively, the N⁺ layers 3 aa, 3 ab, 3 ba, and 3 bb and the P⁺ layers 4 aa and 4 bb may be formed so as to be connected to the side surfaces of the bottom portions of the Si pillars 6 a to 6 f. As described above, the N⁺ layers 3 aa, 3 ab, 3 ba, and 3 bb and the P⁺ layers 4 aa and 4 bb serving as sources or drains of SGTs may be formed in the bottom portions of the Si pillars 6 a to 6 f or may be formed at the outer peripheries of the Si pillars 6 a to 6 f so as to be in contact with the side surfaces of the Si pillars 6 a to 6 f, and may be electrically connected to each other through another conductor material. The same applies to other embodiments according to the present invention.

In the first embodiment, the band-shaped mask material layers 9 a, 9 b, 12 aa, 12 ab, 12 ba, and 12 bb are formed such that the upper surfaces are at the same position and the bottoms are at the same position in the vertical direction. However, the upper surfaces may be at different positions and the bottoms may be at different positions in the vertical direction as long as the object of the present invention is achieved. The same applies to other embodiments according to the present invention.

In the first embodiment, the thickness and shape of the band-shaped mask material layers 9 a, 9 b, 12 aa, 12 ab, 12 ba, and 12 bb vary depending on the polishing by CMP, etching by REF, and cleaning. This variation is negligible as long as the object of the present invention is achieved. The same applies to other embodiments according to the present invention.

The material for each of the various wiring metal layers 34 a, 34 b, WL, Vdd, Vss, BL, and RBL in the first embodiment may be not only a metal, but also a conductive material such as an alloy or a semiconductor containing a large amount of acceptor or donor impurities. The layer formed of such a conductive material may have a single-layer structure or a multilayer structure. The same applies to other embodiments according to the present invention.

In the first embodiment, as illustrated in FIGS. 1JA to 1JC, the TiN layers 24 a, 24 b, 24 c, and 24 d are used as gate metal layers. The TiN layers 24 a, 24 b, 24 c, and 24 d may each be a material layer having a single-layer structure or a multilayer structure as long as the object of the present invention is achieved. The TiN layers 24 a, 24 b, 24 c, and 24 d may each be a conductor layer that at least has a desired work function, such as a metal layer having a single-layer structure or a multilayer structure. Another conductive layer such as a W layer may be formed outside the TiN layers. In this case, the W layer functions as a metal wiring layer for connecting gate metal layers. Instead of the W layer, a metal layer having a single-layer structure or a multilayer structure may be used. Furthermore, the HfO₂ layer 23 is used as a gate insulating layer, but another material layer having a single-layer structure or a multilayer structure may be used. The same applies to other embodiments according to the present invention.

In the first embodiment, the planar shape of each of the Si pillars 6 a to 6 f is a circular shape. For the planar shapes of some or all of the Si pillars 6 a to 6 f, for example, a circular shape, an elliptical shape, and a shape elongated in one direction can be easily formed. In a logic circuit region formed apart from the SRAM cell region, Si pillars having different planar shapes can be formed in a mixed manner in accordance with the logic circuit design. The same applies to other embodiments according to the present invention.

In the first embodiment, the N⁺ layers 3 aa, 3 ab, 3 ba, and 3 bb and the P⁺ layers 4 aa and 4 bb are formed so as to be connected to the bottom portions of the Si pillars 6 a to 6 f. A metal layer or an alloy layer formed of a silicide or the like may be formed on the upper surfaces of the N⁺ layers 3 aa, 3 ab, 3 ba, and 3 bb and the P⁺ layers 4 aa and 4 bb. A P⁺ layer or N⁺ layer containing donor or acceptor impurity atoms may be formed at the outer peripheries of the bottom portions of the Si pillars 6 a to 6 f by, for example, epitaxial growth to form source or drain impurity regions of SGTs. In this case, an N⁺ layer or a P⁺ layer may be formed or may be not formed inside the Si pillar in contact with the N⁺ layer or the P⁺ layer formed by epitaxial growth. An elongated metal layer or alloy layer may be disposed so as to be in contact with the P⁺ layer or the N⁺ layer. The same applies to other embodiments according to the present invention.

In the first embodiment, SGTs are formed on the P layer substrate 1. Instead of the P layer substrate 1, a SOI (Silicon On insulator) substrate may be employed. Another material substrate may be employed as long as it serves as a substrate. The same applies to other embodiments according to the present invention.

In the first embodiment, SGTs in which sources and drains are constituted by forming, on and below the Si pillars 6 a to 6 f, the N⁺ layers 3 aa, 3 ab, 3 ba, 3 bb, the P⁺ layers 44 b, the N⁺ layers 32 a, 32 c, 32 d, and 32 f, and the P⁺ layers 32 b and 32 e that have the same polarity have been described. The present invention can also be applied to tunneling SGTs including sources and drains having different polarities. The same applies to other embodiments according to the present invention.

In the first embodiment, after formation of the gate HfO₂ layer 23 and the gate TiN layers 24 a, 24 b, 24 c, and 24 d, the N⁺ layers 43 a, 43 c, 43 d, 43 e, 43 f, 44 a, 44 c, 44 d, 44 e, 44 f, and 44 h and the P⁺ layers 43 b, 43 g, 44 b, and 44 g are formed. Alternatively, after formation of the N⁺ layers 32 a, 32 c, 32 d, and 32 f and the P⁺ layers 32 b and 32 e, the gate HfO₂ layer 23 and the gate TiN layers 24 a, 24 b, 24 c, and 24 d may be formed. The same applies to other embodiments according to the present invention.

In the second embodiment, the thin Si layer 45 is formed by ALD, and the P⁺ layer 46 containing acceptor impurities is formed by epitaxial growth. The thin Si layer 45 is a material layer for forming a P⁺ layer 46 having good crystallinity. Another material layer having a single-layer structure or a multi layer structure may be used as long as the P⁺ layer 46 having good crystallinity is formed.

The vertical NAND-type flash memory circuit includes a plurality of memory cells stacked in the vertical direction, the memory cells each including a semiconductor pillar as a channel and each including, around the semiconductor pillar, a tunnel oxide layer, a charge storage layer, an interlayer insulating layer, and a control conductor layer. Semiconductor pillars at both ends of these memory cells include a source line impurity layer corresponding to a source and a bit line impurity layer corresponding to a drain. In addition, when one of memory cells on both sides of a certain memory cell functions as a source, the other functions as a drain. Thus, the vertical NAND-type flash memory circuit is one of SGT circuits. Therefore, the present invention can also be applied to mixed circuits with NAND-type flash memory circuits.

Various embodiments and modifications of the present invention can be made without departing from the broad spirit and scope of the present invention. The above-described embodiments are illustrative examples of the present invention and do not limit the scope of the present invention. The above-described embodiments and modifications can be freely combined with each other. Furthermore, embodiments from which some of constituent features of the embodiments are removed as required are also within the technical idea of the present invention.

INDUSTRIAL APPLICABILITY

In the pillar-shaped semiconductor device and the method for producing a pillar-shaped semiconductor device according to the present invention, a high-density pillar-shaped semiconductor device is provided. 

What is claimed is:
 1. A method for producing a pillar-shaped semiconductor device, the method comprising, in a process of forming an static random access memory (SRAM) cell circuit including a surrounding gate transistor (SGT) including a plurality of semiconductor pillars that stand on a substrate in a vertical direction, a gate insulating layer that surrounds the semiconductor pillars, and a gate conductor layer that surrounds the gate insulating layer: a step of forming, as the semiconductor pillars, a first semiconductor pillar that has a first mask material layer on a top portion thereof and a second semiconductor pillar that is adjacent to the first semiconductor pillar and has a second mask material layer on a top portion thereof, the first semiconductor pillar and the second semiconductor pillar forming the SGT; a step of forming a first interlayer insulating layer that is positioned above an upper surface of the gate conductor layer and at outer peripheries of the top portions of the first semiconductor pillar and the second semiconductor pillar; a step of forming, on the first interlayer insulating layer, a first material layer that surrounds side surfaces of the top portion of the first semiconductor pillar and the first mask material layer and a second material layer that surrounds side surfaces of the top portion of the second semiconductor pillar and the second mask material layer; a step of forming a second interlayer insulating layer at outer peripheries in contact with side surfaces of the first material layer and the second material layer; a step of removing the first mask material layer, the second mask material layer, the first material layer, and the second material layer to form a first recessed portion that surrounds the top portion of the first semiconductor pillar and a second recessed portion that surrounds the top portion of the second semiconductor pillar; a step of forming, in the first recessed portion, a first impurity layer that surrounds the top portion of the first semiconductor pillar; a step of forming, in the second recessed portion, a second impurity layer that surrounds the top portion of the second semiconductor pillar; a step of forming a first conductor layer on the first impurity layer and in the first recessed portion; a step of forming a second conductor layer on the second impurity layer and in the second recessed portion; a step of forming a third interlayer insulating layer on the first conductor layer, the second conductor layer, and the second interlayer insulating layer; a step of forming, in the third interlayer insulating layer, a first band-shaped contact hole that partly overlaps and contacts regions of the first conductor layer and the second conductor layer; and a step of forming a first wiring conductor layer connected to the first conductor layer and the second conductor layer such that the first band-shaped contact hole is filled with the first wiring conductor layer, wherein another semiconductor pillar different from the first semiconductor pillar and the second semiconductor pillar is not present in plan view in a region that overlaps the first band-shaped contact hole, and the first impurity layer and the second impurity layer are impurity layers of a load SGT in the SRAM cell circuit.
 2. The method for producing a pillar-shaped semiconductor device according to claim 1, wherein the first conductor layer and the second conductor layer are formed of a metal, an alloy, or a semiconductor containing a large amount of donor or acceptor impurity atoms and have a single-layer structure or a multilayer structure.
 3. The method for producing a pillar-shaped semiconductor device according to claim 1, wherein the first impurity layer and the second impurity layer are formed by epitaxial growth.
 4. The method for producing a pillar-shaped semiconductor device according to claim 1, the method comprising: a step of forming, after formation of the second interlayer insulating layer, a third mask material layer that partly overlaps a region of the first mask material layer and the first material layer and a region of the second mask material layer and the second material layer in plan view and that has an opening in a connected manner; a step of etching the first mask material layer, the first material layer, the second mask material layer, the second material layer, and the second interlayer insulating layer using the third mask material layer as a mask; a step of removing remaining portions of the first mask material layer, the second mask material layer, the first material layer, and the second material layer to form a third recessed portion; a step of forming, in the third recessed portion, a third impurity layer that covers the top portions of the first semiconductor pillar and the second semiconductor pillar and contains the first impurity layer and the second impurity layer in a connected manner; a step of forming a third conductor layer on the third impurity layer and in the third recessed portion; and a step of forming the first band-shaped contact hole on the third conductor layer, wherein the first band-shaped contact hole is formed inside the third conductor layer in plan view.
 5. The method for producing a pillar-shaped semiconductor device according to claim 4, the method comprising: a step of forming a single crystal semiconductor thin film layer on an upper surface in the third recessed portion; and then, a step of forming the third impurity layer and the third conductor layer in the third recessed portion.
 6. A pillar-shaped semiconductor device comprising, in a static random access memory (SRAM) cell circuit including a surrounding gate transistor (SGT) including a first semiconductor pillar that stands on a substrate in a vertical direction, a second semiconductor pillar that stands adjacent to the first semiconductor pillar, a gate insulating layer that has an upper surface positioned lower than top surfaces of the first semiconductor pillar and the second semiconductor pillar and that surrounds the first semiconductor pillar and the second semiconductor pillar, and a gate conductor layer that surrounds the gate insulating layer: a first interlayer insulating layer on the gate conductor layer; a first impurity layer which covers a top portion of the first semiconductor pillar and whose outer periphery is equally spaced with an outer periphery of the first semiconductor pillar in plan view; a second impurity layer which covers a top portion of the second semiconductor pillar and whose outer periphery is equally spaced with an outer periphery of the second semiconductor pillar in plan view; a first conductor layer on the first impurity layer; a second conductor layer on the second impurity layer; a second interlayer insulating layer at outer peripheries of the first impurity layer, the second impurity layer, the first conductor layer, and the second conductor layer; a first band-shaped contact hole that is present in the second interlayer insulating layer and is partly connected to the first conductor layer and the second conductor layer and that connects the first conductor layer and the second conductor layer in plan view; and a first wiring conductor layer connected to the first conductor layer and the second conductor layer such that the first band-shaped contact hole is filled with the first wiring conductor layer, wherein another semiconductor pillar different from the first semiconductor pillar and the second semiconductor pillar is not present in plan view in a region that overlaps the first band-shaped contact hole, the first impurity layer and the second impurity layer are impurity layers of a load SGT in the SRAM cell circuit, and regions of the first conductor layer and the second conductor layer partly protrude outward from the first band-shaped contact hole in plan view.
 7. The pillar-shaped semiconductor device according to claim 6, comprising: a third impurity layer that is connected to the first impurity layer and the second impurity layer and has a region extending on the same surface and that contains the first impurity layer and the second impurity layer; and a third conductor layer on the third impurity layer, wherein the first band-shaped contact hole is present inside the third impurity layer in plan view.
 8. The pillar-shaped semiconductor device according to claim 7, comprising: a single crystal semiconductor thin film layer between a side surface of a third recessed portion and the third impurity layer.
 9. The pillar-shaped semiconductor device according to claim 6, wherein the first conductor layer and the second conductor layer are formed of a metal, an alloy, or a semiconductor containing a large amount of donor or acceptor impurity atoms and have a single-layer structure or a multilayer structure. 